Presentation Details
| Integration of electrical circuit simulations for PV degradation simulations Norman Jost, Brandon K.Byford, Jennifer L.Braid, Clifford W.Hansen. Sandia National Laboratories, Albuquerque, NM, USA |
Abstract
PV module degradation rates are showing an upward trend with multiple new solar‐cell technologies on the market and aggressive cost-saving strategies using thinner glass or low-cost materials. These trends, reported by KIWA-PVEL, not only indicate a general increase but also reveal degradation mechanisms once deemed insignificant such as potential-induced and light-induced degradation. Thinner glass has also led to more cases of cell cracking. A common feature of these mechanisms is their inhomogeneous distribution, affecting each cell in a module differently. In this study, we present how to simulate these degradation mechanisms from the cell level to the module and even string-of-modules level. We use SPICE circuit simulation to examine two specific cases: cell cracking and potential-induced degradation. The simulation tool is being open-sourced, with a simplified version already available on github.sandia.com/pvcracks.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
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