Presentation Details
| Extended Accelerated Stress Testing of Lamination-Free Edge-Sealed Photovoltaic Mini-Modules Steve Johnston1, Ryan Ruhle2, Dana B.Kern1, Kent Terwilliger1, David Durney2, Walajabad Sampath2. 1National Laboratory of the Rockies, Golden, CO, USA.2Colorado State University, Fort Collins, CO, USA |
Abstract
Lamination-free mini-modules are constructed with silicon solar cells between glass sheets and an edge seal of polyisobutylene and silicone. These samples are stressed using a repeated sequential testing sequence including ultraviolet-containing simulated solar spectrum light exposure at elevated temperature, damp heat, humidity freeze, and thermal cycling adapted from the International Electrotechnical Commission (IEC) TS 63209-2:2022. The mini-module performance throughout the stressing is characterized by flash testing and electroluminescence imaging. Results are compared to conventional laminated mini-modules using the same type of solar cells. The lamination-free mini-modules experience up to 8% power loss compared to roughly 3% for the laminated versions. However, those losses, dominated by current and fill factor, are caused by glass soiling and busbar ribbon separation on the cells. When glass is replaced and the stressed cells are contacted with probes bypassing the delaminated ribbons, the initial performance is recovered, and overall losses of the lamination-free samples become negligible.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
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