Extended Accelerated Stress Testing of Lamination-Free Edge-Sealed Photovoltaic Mini-Modules
Steve Johnston, Ryan Ruhle, Dana B. Kern, Kent Terwilliger, David Durney, Walajabad Sampath
Session: Posters - Area 4 (On-Demand)

Capacitance-Based Metastability in Samples Extracted from UV-Stressed Silicon TOPCon Photovoltaic Modules
Steve Johnston, Dana B. Kern, Rebecca B. Wai, Kent Terwilliger
Session: UV-Induced Degradation and Environmental Stability of Materials - Area 8 (Live Event)

Capacitance-Based Metastability in Samples Extracted from UV-Stressed Silicon TOPCon Photovoltaic Modules
Steve Johnston, Dana B. Kern, Rebecca B. Wai, Kent Terwilliger
Session: Posters - Area 8 (On-Demand)

Multiscale Characterization of Aluminum Oxide Passivation Effects in UV-Susceptible TOPCon Photovoltaic Modules
Dana B. Kern, Rebecca Wai, Harvey Guthrey, John Mangum, Chun-Sheng Jiang, Steve Johnston
Session: Advanced Characterization, and Modules - Area 4 (Live Event)

UV-Downshifting Encapsulants for Power Boost and Improved Stability in Photovoltaic Devices
Dana B. Kern, Peter L. Hacke, Rebecca Wai, Xavier Hanna, B. Edward Sartor, Matthew O. Reese, Emily Warren, David C. Miller
Session: Advanced Light Management and Spectral Shaping - Area 1 (Live Event)

Greater UV-induced degradation under UV-fluorescent compare to full spectrum illumination
Rebecca B. Wai, Xavier Hanna, Jimmy M. Newkirk, Kent Terwilliger, Steve Johnston, David C. Miller, Peter L. Hacke, Dana B. Kern
Session: UV-Induced Degradation and Environmental Stability of Materials - Area 8 (Live Event)