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Presentations for Tobias Meßmer

Challenges and solutions for determining the end contact resistance of interconnects based on electrically conductive adhesives with statistical significance
Maria Ignacia Devoto Acevedo, Raphael Shanmugam, Daniel Tune, Tobias Nitsche, Daniel Buckland, Giuseppe Galbiati, Tobias Meßmer
Session: Posters (Characterization Methods) - Area 5 (On-Demand)