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Presentations for Ujjwal K. Das

Correlating Annealing-Induced Electronic and Chemical Degradation of Silicon Heterojunction Cells
Margaret Zeile, Andrew V. Teplyakov, Ujjwal K. Das
Session: High Efficiency, Device Physics, Thin Si, and Reliability - Area 4 (Live Event)

Correlating Annealing-Induced Electronic and Chemical Degradation of Silicon Heterojunction Cells
Margaret Zeile, Andrew V. Teplyakov, Ujjwal K. Das
Session: Posters - Area 4 (On-Demand)

Annealing of Electron-beam Evaporated Nickel Oxide for Hole Transport Layers in p-i-n Perovskite Solar Cells
Chaiwarut Santiwipharat, Kevin D. Dobson, Ujjwal K. Das, William N. Shafarman
Session: Virtual Posters - Joint Area Session (On-Demand)