Presentation Details
| High Spatial Resolution Mapping of Urbach Energy in Photovoltaic Devices Jacques D Kenyon, Kieran M Curson, Xiaolei Liu, Aoshi Yang, Lukša Kujović, Stuart Robertson, Zhaoxia Zhou, Jake W Bowers, John M Walls. Loughborough University, Loughborough, United Kingdom |
Abstract
This work comprises of modelling a fundamental property of semiconductors known as Urbach Energy, indicating energetic disorder at a high resolution/nanoscale using Cathodoluminescence, to bridge the gap between understanding the influence of structural variation and disorder upon recombination behaviour. Mapping/spatially resolving Urbach energy on cross-sectional images of semiconductors used as PV absorbing materials provides an understanding into which fabrication processes and techniques are most detrimental to device performance, and what techniques can help restore it. Examples presented in this work show how structural and elemental variations influence disorder differently, such as grain boundary types, elemental clustering and grading, and stacking fault behaviour.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.