Presentation Details
| Challenges of High-Throughput Measurements for 2T Perovskite–Silicon Tandem Cells Lukas Ziegler. WAVELABS Eternal Sun GmbH, Leipzig, Germany |
Abstract
High-throughput testing plays a critical role in the industrialization of two-terminal (2T) perovskite–silicon tandem solar cells, where measurements are primarily used for device classification, particularly based on electrical power output. However, accurately determining the power output of 2T tandem devices remains challenging, especially in fast measurement environments. The series-connected architecture strongly amplifies sensitivity to spectral conditions. In addition, light-soaking and hysteresis effects introduce significant uncertainties in rapid measurements. Hysteresis originates from both subcells, appearing in different forms in the silicon bottom cell—such as heterojunction (HJT) and TOPCon technologies—and in the perovskite top cell, complicating data interpretation, repeatability and line-to-line comparability. Industrial silicon cell testing routinely operates at cycle times below one second, with the potential to further reduce cycle times through contactless measurement routines. To emerge as a commercially relevant technology, measurement routines must be developed that offer accurate characterization within competitive cycle times. In the study, we outline possible ways towards high throughput testing for 2T-Tandems.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.