Presentation Details
| Subjunction Spatial EL Characterization Technique for Large Area III-V and Si Space Solar Cells Rivka Stasavage, Kyle Virgil, Abigail R.Meyer, Don Walker, Yao Y.Lao. The Aerospace Corporation, El Segundo, CA, USA |
Abstract
In this study, we introduce an electroluminescence (EL) technique that enables spatially resolved characterization of subjunction layers in large area III-V and silicon space solar cells. By exploiting the spectral reciprocity relation between EL emission and quantum efficiency (QE), we extracted individual subjunction current-voltage (IV) curves from complex multijunction devices. A visible-to-short-wave infrared (SWIR) camera, in combination with carefully optimized bandpass (BP) filters, were used to image the EL response at the subjunction level, revealing spatial variations in electrical performance that full-stack measurements can overlook. Validation experiments on a triple junction GaInP/GaInAs/Ge solar cell will compare the IV curves derived from spatial EL images to those obtained using conventional light illuminated IV (LIV) and absolute spectral EL methods. Results suggest that our approach can serve as a robust diagnostic tool for both quality control and the design optimization of large area space-grade solar cells.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
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