Presentation Details
Benchmarking Performance of Wafer-Scale Perovskite/Si Tandems: Methods, Challenges, and Recommendations

Tao Song, Jeremy Brewer, John F.Geisz, Idris Davis, Rafell Williams, Nikos Kopidakis.

National Laboratory of the Rockies, Golden, CO, USA

Abstract


Perovskite/Si tandem photovoltaic technology is rapidly transitioning from laboratory-scale devices to full-size wafer formats, a critical step toward module-product integration and commercial deployment. Accurate and reliable performance rating of wafer-scale tandems is therefore essential. However, this task is complicated by several factors, including advanced contacting schemes such as narrower and increasingly numerous multi-busbar (m-BB) or busbar-less (0-BB) designs, the intrinsically higher measurement complexity of tandem architectures compared with single-junction devices, and the dynamic electrical response of perovskite subcells. Together, these factors make accurate performance testing of wafer-scale tandem devices particularly challenging. In this work, we present a comprehensive measurement protocol for wafer-scale perovskite/Si tandem solar cells, which has been successfully applied to certify multiple record-efficiency devices. We identify key technical challenges associated with wafer-scale tandem testing and propose practical measurement approaches to address them. This study aims to provide a robust benchmarking framework to enable reliable performance assessment and to support the commercialization of perovskite/Si tandem photovoltaics.

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