Presentation Details
| Rapid, High-throughput, Multimodal Characterization of Emergent PV Materials and Device Insights Amy E.Louks2, Ethan G.Schwartz3, Brandon T.Motes1, Anthony T.Troupe1, Axel F.Palmstrom2, Zhaoyang Han4, Qi Jiang4, Joseph J.Berry2, J.Devin MacKenzie3, Minhal Hasham1. 1Optigon Inc., Somerville, MA, USA.2NLR/NREL, Golden, CO, USA.3University of Washington, Seattle, WA, USA.4Chinese Academy of Sciences, Beijing, China |
Abstract
Metal-halide perovskites are leading absorber materials for photovoltaics, with single-junction devices exceeding 27% PCE. Despite this progress, present devices remain below thermodynamic efficiency limits and suffer from insufficient operational stability. Reaching and maintaining these limiting efficiencies requires a holistic understanding of the microscopic mechanisms involved in device degradation; however, conventional characterization is time consuming and low-throughput. Here, we present the Optigon Prism: a rapid, multimodal, and high-throughput metrology tool accelerating materials characterization and production insights. Prism integrates transmission, time-, and spectrally-resolved photoluminescence measurements into one device, capturing holistic datasets, which are used to characterize the response of perovskite solar cells during stress testing and quickly generate device-level insight. We demonstrate that these multimodal datasets can be used to extract and track in situ changes in material parameters during stress testing, which can be diagnostic of overall device performance. Subsequent experiment show that these datasets combined with our analytical framework can be used to infer device properties without needing completed devices. We measure 120 semi-fabricated devices in 10 minutes and use this dataset to infer the open-circuit voltage (VOC) expected from a complete device. Using this full suite of optical characterization, we quantify losses from non-radiative recombination, leading to a realistic estimation of VOC. Our inferred VOC strongly correlates with measured voltages on identical, fully completed sister samples, while our method also captures the effects of electron transport layer deposition on VOC across 5 unique device architectures. Taken together, we show that non-contact optical measurements are a rapid and accurate method to access key metrics relevant to device efficiency and stability, with minimal device fabrication required. Overall, this work demonstrates that rapid and high-throughput optical characterization is invaluable in accelerating the device iteration timeline both by providing in situ material responses to stress testing and device level insight via optical characterization.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
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