Presentation Details
| Residual Strain in Cadmium Telluride Thin Films Kevin D.Dobson, Arivazhagan Valluvar Oli, Brian E.McCandless, William N.Shafarman. Institute of Energy Conversion, University of Delaware, Newark, DE, USA |
Abstract
Propagation of residual strain in CdTe-based thin films is monitored using an x-ray diffraction technique. As-deposited films deposited by vapor-transport or thermal evaporation onto ITO/soda lime glass (SLG) and ITO/TEC-12D substrates showed strong compressive strain through the film depth. Post-deposition anneals of films on SLG relaxed this strain, but strong compressive stress returned following CdCl2 treatment, coinciding with significant grain growth. Anneals of TEC-12D samples had no effect on film strain or morphology. The films on SLG substrates showed high levels of Na out-diffusion from the substrate, which complicated CdCl2 treatment effects. Suitable diffusion barriers are being sought in order to isolate effects of substrate and processing conditions on thin film CdTe residual strain.
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