Presentation Details
| Interface Engineering of Metal Oxide Electron Transport Layers for Reliable OPVs Mahsa Barzgar Vishlaghi, Caroline Brustoloni, Noel Giebink, Stephen Forrest. Departments of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA |
Abstract
Organic photovoltaics (OPVs) are promising renewable energy technology, provided they can combine low-cost, high-efficiency, and long-term operational stability. Metal oxides are utilized as electron transport layers (ETLs) in reliable OPVs. Efficient electron extraction in ZnO often relies on UV light soaking to remove electron-trapping oxygen adsorbates, while the same UV exposure can accelerate photochemical degradation of the organic active layer. Here, we demonstrate an atomic layer deposited (ALD) SnO₂ ETL that exhibits no light-soaking dependence and good electrical performance. We systematically investigate the relationship between interfacial properties, light-soaking behavior, and device lifetime, and show that this mechanistic understanding helps clarify the origins of device reliability and failure.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
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