Presentation Details
| Mechanistic Insights into Scribe‑Induced Halide Migration in Perovskite Solar Modules Tianran Liu1, Jin Wen1, Shuai You1, Xinwen Zhang1, James Brown1, Chenchao Xie1, Lance Wheeler1, Joseph Luther1, 2, Joseph Berry1, 2, Kai Zhu1, Michael Owen-Bellini1, Laura Schelhas1, 2. 1National Laboratory of the Rockies, Golden, CO, USA.2University of Colorado Boulder, Boulder, CO, USA |
Abstract
Perovskite solar modules (PSMs) exhibit reduced stability compared to their device-scale counterparts, largely due to additional degradation pathways introduced by monolithic interconnects. Here, we identify lateral iodide migration at scribed regions as a key driver of module-level degradation. Two dominant pathways are revealed: iodide diffusion into the metal electrode at P2, leading to metal–halide corrosion, and iodide release from exposed perovskite edges at P3, , initiating localized degradation that propagates throughout the packaged PSMs. To mitigate these pathways, we develop a dual strategy combining chemically inert indium zinc oxide (IZO) electrodes and polyolefin elastomer (POE) encapsulation with polyisobutylene (PIB) edge sealing. IZO effectively suppresses iodide-induced electrode corrosion at P2, while POE acts as an iodide sink that captures iodine species released at P3. As a result, the PSM degradation is effectively mitigated. These findings reveal the critical role of scribe-induced lateral iodide migration in module degradation and establish targeted design principles for achieving durable PSMs for outdoor applications.
No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.
No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.