Presentation Details
| Using Fractography to Trace Cracks in PV Modules to the Origin E.Ashley Gaulding1, Elizabeth C.Palmiotti1, Timothy J Silverman1, William B.Hobbs2, Michael G.Deceglie1. 1National Laboratory of the Rockies, Golden, CO, USA.2Southern Company, Birmingham, AL, USA |
Abstract
Spontaneous glass breakage in PV modules has significantly impacted utility PV plants in recent years. Affected sites can have anywhere from <1% to double digit percentages of glass breakage. This is a safety and power generation concern as one module causing a ground fault can cause an entire inverter to shut down. Our previous work identified multiple interacting factors that may contribute to increase probability of glass breakage: decrease of glass thickness, decrease in glass strength, increase in module area, decreasing frame thickness, edge pinch of the laminate. Here, we use classic fractography to trace multiple crack patterns from different utility sites to their area of origin. We develop a methodology to remove the module frame and extract the glass pieces to examine the inner crack surface. Optical microscopy under various lighting conditions and scanning electron microscopy (SEM) are used to look at microscopic features (Wallner lines and lance hackle) in the glass/crack surfaces and identify the suspected point of origin. By identifying the crack origin, we lay the foundation to determine which risk factors play the greatest role in spontaneous crack breakage.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.