Presentation Details
| Greater UV-induced degradation under UV-fluorescent compare to full spectrum illumination Rebecca B.Wai, Xavier Hanna, Jimmy M.Newkirk, Kent Terwilliger, Steve Johnston, David C.Miller, Peter L.Hacke, Dana B.Kern. National Lab of the Rockies, Golden, CO, USA |
Abstract
UV-induced degradation has been identified as a major cause of performance loss in modern silicon photovoltaic (PV) modules. We compare the degradation of eight makes of cells spanning three types of commercial silicon PV cells. Cells are weathered with a xenon source (UV, visible, and infrared light) or a UV fluorescent source (UV-only light). After 4000 hours of aging, we observe an average power loss of -5.0% for PERC, -6.1% for SHJ, and -6.5% for TOPCon cells aged under UV-only light and an average power loss of -0.4% for PERC, -1.6% for SHJ, and -4.7% for TOPCon aged under UV and visible (UV-Vis) light. Most individual cell types, including examples from PERC, SHJ, and TOPCon, exhibit more power loss under the UV-only fluorescent light source commonly used in accelerated aging compared to UV-Vis weathering that more accurately reflects field conditions. A more detailed analysis of UV-ID in TOPCon cells identifies loss in Voc and FF as primary sources of degradation.
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No part of this publication may be reproduced, distributed, or transmitted in any form or by any means, including photocopying, recording, or other electronic or mechanical methods, without the prior written permission of the author.