IEEE PVSC 49
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Thursday, June 9, 2022 1:30 PM Thursday, June 9, 2022 3:00 PM America/New_York AREA 5.5/7.6 AND 5.7/8.4 - ADVANCED CHARACTERIZATIONS AND RELIABILITY OF PV MODULES AND SYSTEMS 204 C aYaMRExkLzQZmPlsLmNx65599
AREA 5.5/7.6 AND 5.7/8.4 - ADVANCED CHARACTERIZATIONS AND RELIABILITY OF PV MODULES AND SYSTEMS
Joint Area Session
Thursday, June 9, 2022
1:30 PM - 3:00 PM     204 C
Chair/Moderator: Mani Tamizhmani, Roger French
1:30
#439

NEAR-BUSBAR DEGRADATION OF SCREEN-PRINTED METALLIZATION IN SILICON PHOTOVOLTAIC MODULES
Dana B. Sulas-Kern, Helio Moutinho, Tristan Erion-Lorico, Steve Johnston
1:45
#440

MAGNETIC FIELD IMAGING (MFI) OF SHINGLE SOLAR MODULES
Julian Weber, Stephan Hoffmann, Kai Kaufmann, Angela De Rose
2:00
#441

ELECTROLUMINESCENCE ANALYSIS AND GRADING OF HAIL DAMAGED SOLAR PANELS
Andrew M. Gabor, Phillip J. Knodle, Maurice Covino, Dylan J. Colvin, Kristopher O. Davis
2:15
#443

MOISTURE INGRESS AND DISTRIBUTION IN BIFACIAL SILICON PHOTOVOLTAICS
Rishi E Kumar, Tala Sidawi, Ian M Slauch, Rico Meier, Mariana I Bertoni, David P Fenning
2:30
#446

SPECTRAL REAR IRRADIANCE TESTING AND MODELING FOR DEGRADATION AND PERFORMANCE OF SOLAR FIELDS
Silvana Ovaitt, Matthew Brown, Chris Deline, Mike Kempe
2:45
#448

PANEL SEGMENTATION: A PYTHON PACKAGE FOR AUTOMATED SOLAR ARRAY METADATA EXTRACTION USING SATELLITE IMAGERY
Kirsten Perry, Christopher Campos