IEEE PVSC 49
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SPLTRAK Abstract Submission
Harsh sequential stress tests for PV durability
Jean Patrice Rakotoniaina, Romain Couderc, Jeremie Aime, Eszter Voroshazi
University of Grenoble Alpes, CEA, LITEN, DTS, INES, Le Bourget du Lac, France

Accelerated aging is required to verify within a few months whether photovoltaic modules are capable of withstanding outdoor conditions for a minimum of 25 years. The IEC 61215 standard is designed to identify the least robust modules through a series of tests. However, these tests are now commonly accepted as insufficient to test the reliability of modules. CEA developed a harsh sequential stress test for PV called STROKE. The goal of the STROKE is to reveal the degradation mechanisms of photovoltaic modules by limiting the duration and number of tests. This approach differs from the approaches of the independent laboratory PVEL which initiated a first approach to improve the consideration of degradation phenomena generated by a higher stress imposed on the modules. The recent IEC 63209 standard is largely inspired by this sequence. However, the sequential aspect is not taken into account and the multiplicity of tests does not optimize the time needed to highlight degradation. A series of tests on commercial references of modules covering the current market allowed to validate the STROKE approach. The aim was to apply the standard to the modules and to compare the time of appearance of performance degradations using the CEA accelerated aging method. The results show a significant time saving on humidity, UV and thermal cycling tests